基于单片机的直流磁滞损耗测量系统设计  

Design of DC Hysteresis Loss Measurement Based on Single Chip

作　　者：只德瑞[1] 黎霞[2] 

机构地区：[1]天津商学院信息工程学院,天津300134 [2]河北工业大学电气与自动化学院,天津300130

出　　处：《河北工业大学学报》2007年第2期104-108,共5页Journal of Hebei University of Technology

摘　　要：为了实现快速、高效测量磁性材料直流磁滞损耗,提出了一种用V/F变换法测量磁性材料直流磁滞损耗的方法,介绍了系统的测量原理和结构,阐述了设计与实现的关键技术,重点介绍了磁滞损耗测量原理、V/F变换测磁通、单片机控制系统实现.该方案能充分满足工业现场测量的便捷、快速、抗干扰的测量要求.In this paper, a method based on V/F transformation is introduced to measure the hysteresis loss for ring-shaped sample,The principle and structure are intrduced.The measurement principle for hysteresis loss,V/F transformer measuring the magnetic flux, the single chip measurement controller is presented in details. The application example shows this technology can meet the requirements of convenience, real-time, Anti- interference.

关 键 词：直流 磁滞损耗 V/F变换 测量 单片机 

分 类 号：TM936[电气工程—电力电子与电力传动]