CA型固体钽电容器的老化筛选方法  

Ageing Screening Methods of CA Type Solid Tantal Capacitors

作　　者：贺光裕[1] 

机构地区：[1]电子工业部第14研究所

出　　处：《电子元件与材料》1997年第1期45-48,共4页Electronic Components And Materials

摘　　要：ＣＡ型固体钽电容器是重要的电子元件，为淘汰早期失效产品，确保高的可靠性水平，采用合适的筛选方法十分必要。介绍了：１．敲击漏电流闪变筛选；２．电参数性能测量筛选；３．温度循环筛选；４．高温电负荷老化筛选；５．高温浪涌电压老化筛选；６．高温漏电流老化筛选；７．密封检验筛选。筛选效果最明显的是４。CA type solid tantal capacitors are important electronic components. It is quite necessary to adopt appropriate screening methods in order to sift out early failing products to quarantee high reliability le vel. This paper articles following methods: 1.screening through leakage flicker due to beat; 2. screening thru electric parameter measurement; 3. screening with the help of temperature cycling; 4.screening thru ageing at high temperature and load; 5.screening thru ageing at high temperature and surge voltage; 6. screening thru ageing at high temperature and leakage current; 7.screening thru inspection of hermetic seal. Among them screening effects in items 4 and 6 are most obvious.

关 键 词：固体钽电容器 可靠性 老化 筛选 

分 类 号：TM535.1[电气工程—电器]