基于k/n(G)模型的STATCOM装置可靠性分析  

Reliability Evaluation of STATCOM Based on the k-out-of-n:G Model

作　　者：鲁宗相[1] 刘文华[1] 王仲鸿[1] 

机构地区：[1]清华大学电力系统国家重点实验室,北京市海淀区100084

出　　处：《中国电机工程学报》2007年第13期12-17,共6页Proceedings of the CSEE

基　　金：国家重点基础研究发展规划973项目(2004CB217907)。~~

摘　　要：提出了STATCOM装置的k/n(G)可靠性模型及其基本分析方法。利用k/n(G)可靠性模型定量描述了主电路拓扑结构的多重化冗余设计所取得的可靠性效益。采用文献提供的IGCT、GTO和IGBT器件可靠性参数,定量计算了某实际应用的50MVA STATCOM装置可靠性指标,并对STATCOM装置结构的优化设计进行了分析;探讨了考虑元件故障率变化的STATCOM动态k/n(G)可靠性模型的基本分析方法。The reliability level of STATCOM devices is an key issue concerned by all of designers, manufacturers and operators. An k-out-of-n： G system model of STATCOM and the basic analysis method for it are proposed in this paper. The k-out-of-n： G system can be used to quantify the reliability benefit of redundancy units in main circuit of STATCOM. Utilizing the basic relability indices of IGCT, GTO and IGBT provided by literatures, the reliability value and MTTF of an practical 50 MVA STATCOM device are evaluated. And the optimal amount of redundant units is analyzed basing on the indices obtained in forenamed study. Finally the dynamic model is proposed to evaluate the reliability of the k-out-of-n： G system when component failure induces higher failure rates in survivors.

关 键 词：静止同步补偿器 装置可靠性 K/N(G)系统 独立同分布元件 优化可靠性设计 

分 类 号：TM76[电气工程—电力系统及自动化]