频率红移法用于激光二极管热阻测量  

Frequency bathochromic shift used for testing the thermal resistors of laser diodes

作　　者：苏美开[1] 倪国强[1] 左眆[2] 

机构地区：[1]北京理工大学光电工程系,北京100081 [2]北京科技大学信息工程学院,北京100083

出　　处：《光电工程》2007年第5期48-51,共4页Opto-Electronic Engineering

摘　　要：给出了“频率(波长)红移法”测量半导体激光二极管热阻Rth的原理:由于温度变化引起LD峰值波长的变化△λ,间接得到温度变化△T;由注入电功率和输出光功率间接得到热耗散功率。克服了以往测试方法复杂、投入高、效率低等不足,而且可以与LD其它参数测试结合,投入少,适合于LD规模化生产和产品研制改进。介绍了Rth测试系统硬件和软件的实现方法以及测试实例。The principle of frequency （wavelength） bathochromic shift used for testing the thermal resistors （Rth） of Laser Diodes （LDs） was given. The temperature change △T was obtained indirectly because the temperature change caused the LDs peak wavelength change△λ. The heat dissipation power was obtained indirectly by the electric power of inpouring and the optical power of output, which overcame the former testing method shortage, such as complexity, high cost and low efficiency etc. Moreover, it also may be combined with LDs other parameters testing. The method is adapted to LDs production, development and improvement. The hardware and software realization method of the Rth testing system as well as the testing example was introduced.

关 键 词：半导体激光器 激光二极管 热阻测量 频率(波长)红移 PIV曲线 

分 类 号：TN248.4[电子电信—物理电子学]