数字下变频器HSP50216原理及测试模式的使用  

Principles of Digital Down Converter HSP50216 and the Use of Its Test Mode

作　　者：罗亚松[1] 高俊[1] 

机构地区：[1]海军工程大学,武汉430033

出　　处：《半导体技术》2007年第2期170-173,共4页Semiconductor Technology

基　　金：国家部委基金项目

摘　　要：通过对数字下变频器HSP50216内部结构、工作原理及性能特点的介绍,给出了其在下变频处理中的应用。另外,该芯片配有一个测试模式,它通常用来进行芯片检测。给出了利用测试模式来使HSP50216完成数字化激励器中基带处理功能的另外一种应用。实践证明这种方法是可行的,提高了对测试模式使用的灵活性,并以此扩展了HSP50216的功能,满足更多情况的需要。By discussing the inside structure, the working principle and feature of the digital down converter HSP50216 and its use in down - conversion process were given. HSP50216 had a test mode which was generally used to examine the chip. How to use the test mode to make the chip deal with the base-band signals in the digital sender was also included. This method was checked up through practices and proved to be feasible. As a result, the flexibilities of the test mode and the functions of the HSP50216 are enlarged which make HSP50216 meet more circumstances needs.

关 键 词：测试模式 数字下变频器 软件无线电 

分 类 号：TN773[电子电信—电路与系统]