MoSi_2发热体电阻率—温度曲线测试系统的设计  

Design and Realization of Resistivity-Temperature Curve Measuring System for MoSi_2 Heating Element

作　　者：林振衡[1] 

机构地区：[1]莆田学院电子信息工程系,福建莆田351100

出　　处：《莆田学院学报》2007年第2期87-91,共5页Journal of putian University

基　　金：福建省教育厅科研基金项目(JB06160);莆田学院科研基金项目(2006Y007)

摘　　要：针对MoSi2发热元件是一种非线性小电阻元件,且其电阻率—温度曲线的测量温度范围大(0℃—1700℃)的特点,采用恒流源法结合四引线法设计出一套测量温度从0℃至1650℃的MoSi2发热元件的电阻率—温度曲线测试系统,并根据误差理论,结合测试系统在室温31℃和高温1600℃时具体的测试条件和实际测试结果,对该测试系统的不确定度进行分析。分析结果表明该测试系统具有较高的测量精度。Because MoSi2 Heating element is a kind of non-linear small receptivity element and its resistivity-temperature ranges from 31℃ to 1700℃, a measuring system which was based on constant current source measurement and four probes measurement was designed. The system could measure out the resistivity-temperature curve from 0℃ to 1650℃. According to the testing results measured on 31℃ and 1600℃, we analyzed the uncertain degree of survey basing on the error theory, The analysis of the system showed that the system had high measuring accuracy.

关 键 词：MoSi2发热元件 电阻率—温度曲线 测试系统 不确定度 

分 类 号：TG146[一般工业技术—材料科学与工程]