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作 者:陈义芳 周卫东 刘爱平[2] 陈刚[3] 孙国荣[2]
机构地区:[1]扬州大学测试中心,江苏扬州225009 [2]扬州大学生物科学与技术学院,江苏扬州225009 [3]扬州大学农学院,江苏扬州225009
出 处:《江苏农业学报》2007年第2期93-97,共5页Jiangsu Journal of Agricultural Sciences
基 金:国家自然科学基金项目(30270234)
摘 要:利用环境扫描电镜结合X射线电子探针显微分析技术,研究了水稻籽粒不同部位P与Al、Cd、Pb含量的关系。结果表明:金属元素Al、Cd、Pb和其他矿质元素一样,也在糊粉层中积累最多;水稻籽粒中P的积累与Al、Cd、Pb的富集有密切关系;其中,籽粒不同部位P与Al的含量存在极显著的正相关关系,而Pb和Cd的含量并不随着P含量的增加而增加,其变化幅度较小。说明P对Al的富集具有促进作用。By means of environmental scanning electron microscopy and X-ray electron probe microanalysis,the relationships between relative content of P and those of Al,Cd and Pb in different parts of rice grains were studied. The contents of P,Al, Cd and Pb in rice grain were higher in aleuronic layer while they accumulated little in the center of caryopsis. The P accumulation in rice grains was closely correlated with the enrichments of Al ,Cd and Pb, and the significant positive correlation was found between the contents of P and Al in different parts of rice grains,which indicated that the enrichment of Al was promoted by P-accumulation. Besides,with the increase of P, the contents of Pb and Cd did not increase accordingly.
关 键 词:水稻籽粒 重金属 X射线电子探针显微分析 富集
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