X射线衍射角度的单片机测量系统  

A Monolithic Computer System for Measuring X Ray Diffraction Angles

作　　者：王悦敏[1] 钱永庚[1] 杜彦从[1] 

机构地区：[1]清华大学工程物理系,北京100084

出　　处：《核电子学与探测技术》1997年第1期64-66,共3页Nuclear Electronics & Detection Technology

摘　　要：为精确测量 X 射线衍射角度,并使测量过程逐步智能化,开发了以8031为基础的单片机光编码角度测量系统,用以代替原有的机械角度测量系统,测角精度为10″,无往复调整误差.In order to measure X ray diffraction angles accurately,and to intellectualize the measuring process,a new monolithic computer system for measuring diffraction angles was developed,which is based on 8031 and replaced the original mechanical system.The angular accuracy is <10 seconds.The system is stable,reliable and works perfectly.

关 键 词：X射线衍射 角度测量系统 单片机 晶体测角 

分 类 号：O713.1[理学—晶体学]