光盘的可靠性试验  

Reliability of Optic Disks

作　　者：荆玉兰[1] 姜书艳[1] 

机构地区：[1]电子科技大学科技处

出　　处：《电子科技大学学报》1997年第2期162-166,共5页Journal of University of Electronic Science and Technology of China

摘　　要：利用加速试验和Ａｒｒｈｅｎｉｕｓ图方法，预测光盘的寿命，估算出常温下光盘的寿命为２０年，通过环境试验对光盘的力学特性和记录特性进行了测试，试验结果表明，各种环境试验有的对光盘的力学特性有轻微影响，有的在记录特性如记录层的反射率、ＢＥＲ上有轻微变化。通过分析磁光盘磁光记录层的衬底及保护层的特性及失效机理，提出了提高磁光盘可靠性的途径。文中从寿命预测和环境试验讨论了光盘的可靠性。The estimated service life of optic disks at the normal temperature is 20 years by use of the acceleration experiment and Arrhenius figure.The specific properties of mechanics and record of optic disks is tested through environment experiment.The test results indicate that some of the experiments lightly influenced the specific properties of mechanics,the others triflingly affect that of record,such as the reflection rate of recording layer,BER,etc.The way of improving the reliability of megneto optic disk is raised preliminarily by analyzing the specific properties,the stale mechanism of the base of megnesto optic recording layers and the protective layer.

关 键 词：光盘 加速测试 环境测试 可靠性 光存贮器 

分 类 号：TP333.402[自动化与计算机技术—计算机系统结构]