组合数字集成电路测试生成技术研究  

Research on test-generation technology of combined digital IC

作　　者：张必超[1] 于鹏[1] 

机构地区：[1]西南电子电信技术研究所,四川成都610041

出　　处：《中国测试技术》2007年第3期105-107,共3页CHINA MEASUREMENT & TESTING TECHNOLOGY

摘　　要：介绍了数字集成电路测试的基本概念,包括测试的分类,以及可控性、可观性、可测性、故障、失效和缺陷等概念;概述了测试的基本过程及测试生成概念和原理;着重阐述了组合数字集成电路的各种测试生成算法,包括异或法、步尔差分法、路径敏化法、D算法、PODEM算法和FAN算法等,这些算法是测试图形生成的基本方法,在具体应用中可灵活选用。This article introduced the basic conception of combined digital IC, including classification of digital IC test, controllability, observation, testability, fault, limitation and invalidation etc. Then it summarized theory of test generation and test process of combined digital IC. It emphasized test-generating algorithms of digital IC. These algorithms included BULL differences, XOR, PATH sensitize, D, PODEM and FAN algorithm and were all basic algorithms of test generation that can be used in different applications.

关 键 词：组合数字集成电路 可测性 失效 测试生成 算法 

分 类 号：TP211[自动化与计算机技术—检测技术与自动化装置]