纯硒中杂质元素的ICP-AES测定  

Dertermination of Al,As,Bi,Cu,Pb,Ni,Sn,Te,Mg,Fe,Sb and B in Purity Selenium by ICP-AES

作　　者：熊晓燕[1] 麦丽碧[1] 

机构地区：[1]广州有色金属研究院分析测试中心

出　　处：《光谱实验室》2007年第3期313-315,共3页Chinese Journal of Spectroscopy Laboratory

摘　　要：电感耦合等离子体-原子发射光谱同时测定纯硒中的碲、铅、铋、锑、铜、铁、镍、镁、铝、锡、砷和硼12种元素的含量,优化出各元素的分析波长和分析条件;用基体匹配补偿基体效应,方法简单,快速可靠,样品回收率为94%—107%。The twelve impurity elements in purity selenium were determined by ICP-AES. The optimum analytical line of each element was confirmed. The matrix matching method was used to correct the matrix effect. This method is simple rapid and reliable. The recoveries are in the range of between 94% to 107%.

关 键 词：纯硒 杂质元素 电感耦合等离子体-原子发射光谱法 

分 类 号：O657.31[理学—分析化学]