复合电镀包埋法制备纳米颗粒材料透射电镜试样  

Preparation of TEM specimens of nanoparticles embedded in copper through composite electroplating

作　　者：马跃飞[1] 徐明[1] 施书哲[1] 刘云飞[1] 方芳[1] 吕忆农[1] 

机构地区：[1]南京工业大学材料科学与工程学院,江苏南京210009

出　　处：《南京工业大学学报（自然科学版）》2007年第3期44-46,共3页Journal of Nanjing Tech University(Natural Science Edition)

摘　　要：提出了一种方便实用的制备较大纳米颗粒材料透射电子显微镜(TEM)试样的方法.系统研究了电流密度和电镀时间对复合镀层的影响.通过TEM对该法制得的试样进行观察,可以得到清晰的高分辨透射电子显微像.结果表明,实验所用的钛酸锶钡纳米颗粒的生长机理是由无定形物向晶体转变的过程.运用复合电镀工艺制备TEM试样为较大的纳米材料的TEM表征提供了有效的途径.A new method of making TEM specimens was introduced. The dependence of thickness and relative density on the deposition time and current density were systematically studied. High-resolution transmission electron microscopy images were clearly obtained. The results showed that the growing mechanism of the nanoparticles used is from amorphous to crystal. The proposed method is a very effective way for the characterization of the large nanomaterials.

关 键 词：TEM试样制备 复合电镀 纳米颗粒材料 

分 类 号：TQ153[化学工程—电化学工业]