IR FPA读出电路电注入测试系统  

Current Injection Testing of the IR FPA Read-Out Circuit

作　　者：孟丽娅[1] 袁祥辉[1] 程瑶[1] 吕果林[1] 黄友恕[1] 

机构地区：[1]重庆大学光电技术及系统教育部重点实验室,重庆400030

出　　处：《电子器件》2007年第3期915-917,共3页Chinese Journal of Electron Devices

摘　　要：利用电流注入方式可以方便地模拟光电流注入,从而对红外焦平面阵列读出电路进行参数测试.采用NI公司的MIO-16E-1数据采集卡,通过软件编程,低成本、高效率地实现了读出电路的参数测试系统.使用多帧统计计算的方法对读出电路阵列的均方根噪声、动态范围和非均匀性等参数进行了测试.测试结果表明成品率达到64%以上,该批合格管芯已成功用于成像实验.The parameter testing of readout circuit （ROIC） chip for infrared focal plane array （IR FPA） are carried out with current injected, instead of photocurrent input. Based on the MIO-16E-1 of National Instruments Corporation, this testing system is efficiently and economically implemented with software programming. The testing procedure uses the frames statistics computation method to calculate the dark noise, dynamic range and non-uniformity. The result shows that the yield is beyond 64%, and these dies have successfully worked in the imaging experiment.

关 键 词：红外技术 参数测试 虚拟仪器 读出电路 

分 类 号：TN21[电子电信—物理电子学]