基于SOC测试的IEEE P1500标准  

IEEE P1500 Standard Based on SOC Test

作　　者：张颖[1] 吴宁[1] 

机构地区：[1]南京航空航天大学信息与技术学院,南京210016

出　　处：《电子测量技术》2007年第5期119-121,141,共4页Electronic Measurement Technology

摘　　要：集成电路深亚微米工艺技术和设计技术的迅速发展使得系统芯片SOC的应用越来越广泛,而随着SOC规模的不断扩大,测试问题日益成为制约其技术发展的"瓶颈",其解决的关键是嵌入式核测试的复用。本文介绍了国际上正在制订的嵌入式核测试标准IEEE P1500,该标准旨在规范核测试接口,提高SOC级测试集成的效率。文中给出了嵌入式核测试的体系结构、P1500的主要组成部分——Wrapper结构和核测试语言CTL,以及该标准与其他协议的比较。With the rapid development of deep submicron meter manufacture technology and design technology of integrated circuits, System-on-Chip is increasingly used. As the design scale is more complex than ever, testing has been the choke point of technology development on SOC. In fact, an efficient approach is the reuse-based test strategy. The paper introduces an embedded core test standard under development—— IEEE P1500, which is meant to standardize test interface and improve test integration on core-based SOC. The embedded test architecture and the composition of P1500 are described in detail.Comparison between P1500 and other standards are introduced as well.

关 键 词：SOC 测试 P1500 

分 类 号：TN407[电子电信—微电子学与固体电子学]