薄差水淹储层自然电位测井曲线的校正方法  

The environment factor correction method of spontaneous potential curve in thin and poor water flooded reservoirs

作　　者：李雪英[1] 蔺景龙[1] 荆万学[2] 王伟男[2] 

机构地区：[1]大庆石油学院地球科学学院,黑龙江大庆163318 [2]大庆石油管理局钻探集团测井公司,黑龙江大庆163412

出　　处：《大庆石油学院学报》2007年第3期11-14,共4页Journal of Daqing Petroleum Institute

摘　　要：层厚薄、泥质体积分数大、水淹后存在残余烃类、过滤电位异常是影响薄差水淹储层自然电位幅值高低的主要因素.为提高水淹地层混合地层水电阻率计算精度,从自然电位产生机理角度出发,提出了薄层、高含泥、水淹储层的静自然电位的求取方法.实际资料处理表明,利用校正后的静自然电位计算的地层水电阻率与水分析资料计算的地层水电阻率相比,其平均相对误差小于10%,取得很好的效果,特别是在1m以下的薄层校正方法具有创新性.Low spontaneous potential (SP) amplitude of thin and poor water flooded reservoir may be caused by several factors, such as thin layer, high shale content, influenced by residual hydrocarbon after water out and electrofiltration potential. Therefore, a series of correct methods are needed to interpret mixed fluid resistivity more accurately in water flooded formation. A method by which Static spontaneous potential (SSP)is obtained in thin layer, high shale content, water flooded reservoir is proposed through mechanism analysis of SP. Actual filed data are processed by using this technique and processing result indicated that the formation water resistivity computed by the SSP after corrected compared with formation water resistivity obtained by water analysis data, and the relative error is smaller than 10%. Especially the SP correct method is innovated in the thin layer whose thickness is less than 1 meter.

关 键 词：薄差层 环境校正 静自然电位 水淹层 过滤电位 地层水电阻率 

分 类 号：P631.8[天文地球—地质矿产勘探]