串并联可修系统的可靠性  

The reliability of repairable series-parallel system

作　　者：谭利[1] 顾九华[1] 

机构地区：[1]中南大学数学科学与计算技术学院,长沙410075

出　　处：《数学理论与应用》2007年第2期31-35,共5页Mathematical Theory and Applications

摘　　要：本文通过密度演化法讨论了部件的寿命和修理时间都服从一般分布的由n个不同子系统串并联组成的可修系统的可靠性,为串并联系统的可靠性研究提供了理论依据.This paper is devoted to studying the reliability of the repairable series-parallel system which consists of N-different subsystems. The life-span and repair time of the components are subject to general distributions. Density evolution method is used to solve the problem. And it provides theoretical foundation to the study of the reliability of repairable series--parallel system.

关 键 词：串并联可修系统 可靠性 密度演化法 

分 类 号：O213.2[理学—概率论与数理统计]