基于小波变换的投影光栅条纹分析  

Projected Fringe Patterns Analysis Based on Wavelet Transform

作　　者：杨诚[1] 于德敏[1] 许增朴[1] 王永强[1] 

机构地区：[1]天津科技大学机械工程学院,天津300222

出　　处：《天津科技大学学报》2007年第2期40-44,共5页Journal of Tianjin University of Science & Technology

基　　金：天津市自然科学基金资助项目(013602211)

摘　　要：投影光栅条纹相位法通常用于三维物体形貌的测量.采用小波变换直接提取单幅光栅条纹图像的相位分布,不需要进行相位展开,即可得到物体表面轮廓.给出了小波分析应用在空间载波光栅条纹相位分析中的理论推导证明、计算机模拟以及实验验证结果,讨论了小波分析的抗噪能力,证实了该方法的可行性.Phase approaching of projected grating is used usually in the measurement of three dimensional surface. Wavelet transform algorithm has been used to extract directly the phase distribution from fringe single pattern without phase unwrapping step, thus the surface profile of the object is obtained. The theory, simulation result and an example of three dimensional shape measurement were given. The de-noising ability of wavelet analysis was also discussed. Theory and simulation results show that method is practicable.

关 键 词：小波变换 条纹投影 相位提取 轮廓测量 

分 类 号：TN911.73[电子电信—通信与信息系统]