利用公用背底法提高X射线应力分析效率  

On the Common Background Method for X-ray Stress Measurement

作　　者：贺笑春[1] 李家宝[1] 

机构地区：[1]沈阳材料科学国家(联合)实验室,沈阳110016

出　　处：《无损检测》2007年第4期185-188,共4页Nondestructive Testing

摘　　要：为了提高X射线应力分析的效率,提出了公用背底法对衍射线进行背底扣除。并利用模拟衍射线考察了对于不同峰形的衍射线、公用背底法对残余应力值的影响以及合理的背底取值范围。结果表明,对于峰背比较大的衍射线,公用背底法扣除背底对应力值没有影响,可用来进行应力测定;而对于峰背比较小的衍射线,不适合采用公用背底法扣除背底。利用公用背底法进行应力测定,可以大幅度缩减扫描范围,提高测定效率。The common background method dealing with the background of diffraction profile was presented to increase the efficiency of X-ray stress measurement. For the diffraction profiles with different ratios of peak intensity to background intensity （Ip/IB）, effect of the method on the results of the stress analysis was discussed and the right background range was propose＆ For the diffraction profiles with higher IP/IB, the method had no influence on the results of the stress analysis and could be employed. But it was unfeasible to the diffraction profiles with lower IP/IB. And the method could greatly increase the efficiency of X-ray stress measurement by shortening the scanning range of the stress analyzer.

关 键 词：模拟衍射线 残余应力 公用背底法 应力测定 半高宽 峰位角 

分 类 号：TG115.222.2[金属学及工艺—物理冶金]