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机构地区:[1]中国科学院上海技术物理研究所,上海200083
出 处:《光电工程》2007年第7期84-87,共4页Opto-Electronic Engineering
基 金:中科院创新课题
摘 要:分析了红外焦平面阵列探测元的响应模型以及响应特性与入射辐射、积分时间的关系,指出了实际工程中常用的两点黑体辐射定标校正算法的本质在于利用高低温时不同的响应数据计算增益系数与偏置系数。与此相类似,通过调整积分时间也能得到不同的响应数据,因此提出基于积分时间调整的校正算法,利用不同积分时间下的响应数据计算校正时所需的增益系数与偏置系数。实验结果表明,选择合适的积分时间个数后,新方法校正效果优良,可完全用于工程应用,并可克服黑体定标校正算法的不足。The Infrared Focal Plane Array (IRFPA) detector response model was analyzed with the relationship of response characteristic with incident radiation and integration time. In nature, two-point blackbody radiometric calibration non-uniformity correction algorithm is to calculate gain coefficient and bias coefficient with different response data of high and low temperature. Homoplastically, different response data could also be gotten by adjusting integration time. Therefore, a new approach based on integration time regulation was proposed, in which different response data from different integration time was used to calculate gain coefficient and bias coefficient. Experiments show that choosing proper number of integration time, the proposed algorithm can achieve good performance and can be applied in real imaging system. The disadvantage of blackbody calibration non-uniformity correction algorithm can also be avoided.
分 类 号:TN214[电子电信—物理电子学]
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