共振线俘获对碰撞激发X光激光增益特性的影响  

THE EFFECT OF TRAPPING IN RESONANCE LINES ON THE GAIN OF ELECTRONIC COLLISION EXCITATION X-RAY LASERS

作　　者：张毓泉[1] 张覃鑫[1] 王光裕[1] 于敏[1] 

机构地区：[1]北京应用物理与计算数学研究所

出　　处：《强激光与粒子束》1997年第2期167-177,共11页High Power Laser and Particle Beams

基　　金：国家863惯性约束聚变领域资助

摘　　要：以类氖－锗离子为例，用逃逸概率方法研究了共振线俘获效应对电子碰撞激发Ｘ光激光增益特性的影响。对波长为１９．６ｎｍ，２３．２ｎｍ和２３．６ｎｍ等三条激光线。Using escape probability method,the effects of radiation trapping on inver sion and gain of electron collisional excitation pumping X ray laser lines are studied in this paper.As an example,the dependence of the inversion and gain of laser lines at19.6nm and 23 2nm and 23 6nm in neon like germanium ion on spatial width of

关 键 词：共振线俘获 增益 逃逸概率方法 X光激光 激光 

分 类 号：TN241[电子电信—物理电子学]