左右手系材料界面处全反射行为的特性  

Characteristics of total reflection at interface between left-handed and right-handed materials

作　　者：石刚[1] 岑洁萍[1] 樊莉[1] 刘拥军[1] 

机构地区：[1]扬州大学物理科学与技术学院,扬州225000

出　　处：《物理学报》2007年第8期4653-4656,共4页Acta Physica Sinica

基　　金：江苏省高等学校自然科学基金(批准号:05KJB14047)资助的课题.~~

摘　　要：基于电磁场理论,推导了左右手系材料界面处发生全反射时的物理特性,分析了相位变化情况.提出利用左右手系材料构成周期性结构,观测全反射时介质中隐失波干涉的实验设想,并从理论上计算了干涉条纹的分布.Characteristics of total reflection at the interface between left-handed and right-handed materials are derived from electromagnetic theory, and the phase is researched. The experimental idea of observing interference fringes of evanescent waves, when total reflection takes place at the interface is discussed, and the distribution of interference fringes is calculated from electromagnetic theory.

关 键 词：左手材料 负折射率 全反射 隐失波 

分 类 号：O442[理学—电磁学]