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作 者:王擎雷[1] 吴惠桢[1] 斯剑霄[1] 徐天宁[1] 夏明龙[1] 谢正生[2] 劳燕锋[2]
机构地区:[1]浙江大学物理系,杭州310027 [2]中国科学院上海微系统与信息技术研究所信息功能材料国家重点实验室,上海200050
出 处:《物理学报》2007年第8期4950-4954,共5页Acta Physica Sinica
基 金:国家自然科学基金(批准号:10434090);教育部博士点基金(批准号:20060335035)资助的课题.~~
摘 要:采用分子束外延的方法在BaF2(111)衬底上制备出了高质量的Pb1-xMnxSe(0≤x≤0.0681)薄膜.X射线衍射结果表明,Pb1-xMnxSe薄膜为立方相NaCl型结构,没有观察到MnSe相分离现象,薄膜的取向为平行于衬底(111)晶面.晶格常数随着Mn含量的增加逐渐减小,Mn含量由Vegard公式得到.通过理论模拟Pb1-xMnxSe薄膜的透射光谱,得到了Pb1-xMnxSe薄膜的带隙与Mn组分的关系,Pb1-xMnxSe薄膜的带隙宽度由0.28eV(x=0)按e指数形式增加到0.49eV(x=0.0681).同时还获得了Pb1-xMnxSe薄膜在波长为4—9.5μm间的折射率.High quality Pb1-xMnxSe(0≤x≤ 0.0681 ) thin films have been grown on BaF2 (111) substrates by molecular beam epitaxy. Optical and structural properties of the Pb1-xMnxSe films have been studied using transmission spectrum and high resolution X-ray diffraction(HRXRD). HRXRD patems indicate that Pb1-xMnxSe films have cubic-phase structure, and MnSe phase separation is not observed. The film orientation is parallel to (111 ) surface of substrate. The lattice constant of Pb1-xMnxSe films decreases with increasing Mn content. The Mn content can be obtained by using Vegard' s formula. Sharp absorption edges were observed in the transmission spectrum of Pb1-xMnxSe films. The fundamantal band gap of the Pb1-xMnxSe films was obtained by simulation, which increases almost exponentially from 0.28 eV at x = 0 to 0.49 eV at x = 0.0681. The refractive index in the wavelength ranged from 4 to 9.5μm has also been obtained.
关 键 词:Pb1-xMnxSe外延薄膜 透射光谱 带隙 折射率
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