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作 者:Lu Lei LIQing-shan LiLi ZHANGLi-chun WANGCai-feng QlHong-xia ZHENGMeng-meng
机构地区:[1]CollegeofPhysicsandEngineering,QufuNormalUniversity,Qufu273165,China [2]LudongUniversity,Yantai264025,China [3]LaserInstituteofQufuNormalUniversity,Qufu273165,China
出 处:《Optoelectronics Letters》2007年第4期286-288,共3页光电子快报(英文版)
基 金:Supported by the Nature Science Foundation of Shandong Province under Grant No Y2002A04
摘 要:Aluminum nitride (AlN) films with h〈100〉 crystalline orientation are fabricated on p-Si (100) substrates at room tempera- ture by pulsed laser deposition. The effects of laser energy density and annealing on the quality of the films are studied by x-ray diffraction, Fourier transform infrared spectroscopy and scanning electron microscopy. The crystalline quality of AlN films is improved considerably by increasing the laser energy density while there is increased number of farraginous particles on the surface. The annealing treatment at 600~C produces a recrystallization process in the film, characterized by the improvement of the original crystallinity, the appearance of new crystalline orientations, and the increase of the crystallites. The surface becomes rougher due to the increase of the grain size during annealing.
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