低压驱动薄膜电致发光激发效率分布特性的实验研究  

Experimental Study of Excitation Efficiency Distribution in Low Voltage Driven Thin Film Electroluminescent Devices

作　　者：张家雨[1] 叶永红[1] 顾培夫[1] 刘旭[1] 唐晋发[1] 

机构地区：[1]浙江大学现代光学仪器国家重点实验室

出　　处：《光学学报》1997年第1期97-101,共5页Acta Optica Sinica

摘　　要：分析了利用探针层（ｐｒｏｂｅ－ｄｏｐｅｄｌａｙｅｒ）实验方法来测量激发效率在电致发光器件的发光层中分布的机理，并利用这种实验方法测量了激发效率在低压驱动薄膜电致发光器件的发光层中的分布特性和器件的激发特性。实验结果表明在这种低压驱动电致发光器件的发光层中激发效率是不均匀的，其分布与器件被激发的程度有关。In this paper, we analyze the mechanism of the probe doped layer measurement to study the excitation efficiency distribution across the phosphor in thin film electroluminescent devices. The characteristics of excitation efficiency and its distributionacross the phosphor are measured in low voltage driven thin film electroluminescent devices fabricated in our laboratory. The experimental results prove that the excitation efficiency across the phosphor of the device is not homogeneous, and its variation depends on the applied voltage. We infer that the low voltage driven thin film electroluminescent mechanism is attributed to inhomgeneous distribution of electric field in the phosphor.

关 键 词：薄膜 电致发光器件 激光效率 

分 类 号：TN383.1[电子电信—物理电子学]