薄膜X射线测厚仪  

X-ray Thickness Gauge for Plastic Film

作　　者：靳其兵[1] 江晶[1] 

机构地区：[1]北京化工大学自动化研究所,北京100029

出　　处：《仪表技术与传感器》2007年第5期18-19,共2页Instrument Technique and Sensor

摘　　要：介绍了以西门子PLC(可编程控制器)用于薄膜测厚的全自动往复式X射线测厚仪的研制,介绍了该测厚仪的硬件构成和测厚的工作原理。该装置已成功应用在双向拉伸聚丙烯薄膜生产线上。It described X-ray thickness gauge apparatus for plastic film including its working principle and hardware of its control system and the method of data processing, The equipment has been applied to BOPP product line successfully.

关 键 词：测厚仪 X射线 薄膜 

分 类 号：TH821.1[机械工程—仪器科学与技术]