集成光电探测器绝对光谱响应度测试研究  

Research the Development of Absolute Spectral Response for Integrated Photodetector

作　　者：陈世军[1] 袁红辉[1] 丁毅[1] 王欣[1] 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《激光与红外》2007年第8期765-768,共4页Laser & Infrared

摘　　要：分析了光电探测器的结构及光谱响应度的测试原理,基于LabVIEW图形化软件,研制了一套0.2～1.1 μm的光电探测器绝对光谱响应度测试装置.本系统采用单光路小光点标准替代法进行测量,系统组成灵活并可扩展,配合自行研制的驱动电路和采样保持电路,可以满足不同器件的需要.采用本系统对上海技物所研制的多种集成光电探测器的绝对光谱响应度进行测试,测试结果表明了系统的可行性.The structure and the testing principle of spectral response of photodetector were analyzed. A device used for testing absolute spectral response with wavelength ranged from 0.2μm to 1.1 μm is developed by LabVIEW. This system used single optical channel substituted measurement methods, it is flexible and expandable with clock driver and sample and hold circuit that were developed by ourselves, it can satisfy the needs for measuring various devices. The experiment of testing integrated photodetector was achieved using this system. The result verifies to the feasible of this system.

关 键 词：光电探测器 绝对光谱响应度 LABVIEW 虚拟仪器 

分 类 号：TN364[电子电信—物理电子学]