八探针方法测量磁阻效应  

8-Point Magnetoresistance Measurements

作　　者：张恒[1] 龚小燕[1] 张义炳[1] 阚敏 

机构地区：[1]上海大学物理系,上海201800

出　　处：《物理测试》1997年第3期21-24,共4页Physics Examination and Testing

摘　　要：本文提出八探针方法用来测量薄膜的幅度磁阻(MMR)和各向异性磁阻(AMR)。测量时,外加磁场方向不变,通过改变电流方向来改变磁场和电流方向的夹角,分别测得薄膜处于同一磁化状态下的电流和外场相互垂直或平行时的电阻。通过在不同幅度磁场下的测量,可以得到AMR随外加场幅度的变化以及电流和外场相互垂直或平行时随外加场幅度变化的MMR。In this paper we give an 8 -point magnetoresistance measurement tor MMK Cmagnetoresistance connected with the magnitude of the applied field) and AMR (magnetoresistance connected with the angle between the current and the applied field). In the measurements, the direction of the applied field do not change, different resistance is measured in the applied field with certain magnitude when the direction of the current is parallel or perpendicular to the applied field. Through measurements in the applied field with different magnitude we can get AMR's variation with the magnitude of the applied field and MMR in condition that the current is parallel or perpendicular to the applied field.

关 键 词：薄膜 磁阻效应 测量 八探针法 

分 类 号：O484.5[理学—固体物理]