High Power Microwave Test System and Simulated Experiments for HT-7  

作　　者：王茂 单家方 刘甫坤 徐旵东 俞家文 丁伯江 匡光力 

机构地区：[1]Institute of Plasma Physics,Chinese Academy of Sciences,Hefei 230031,China [2]School of Management,Hefei University of Technology,Hefei 230009,China

出　　处：《Plasma Science and Technology》2007年第4期500-503,共4页等离子体科学和技术（英文版）

摘　　要：In lower hybrid current drive （LHCD） experiments in HT-7, LH wave coupled to the plasma from 12 klystrons is launched by a phased multi-junction grill. High power microwave reflection or arc, which threatens the klystrons, the wave-guide ceramic windows and the vacuum of the tokamak, occur sometimes during the experiments. For the sake of safety, a high power microwave test system to perform simulations was developed. In the test experiments, the klystron and window can be well protected with an optimized microwave monitor and a PIN switch. The layout of the test system and the simulated experiments for HT-7 are described in this paper.In lower hybrid current drive （LHCD） experiments in HT-7, LH wave coupled to the plasma from 12 klystrons is launched by a phased multi-junction grill. High power microwave reflection or arc, which threatens the klystrons, the wave-guide ceramic windows and the vacuum of the tokamak, occur sometimes during the experiments. For the sake of safety, a high power microwave test system to perform simulations was developed. In the test experiments, the klystron and window can be well protected with an optimized microwave monitor and a PIN switch. The layout of the test system and the simulated experiments for HT-7 are described in this paper.

关 键 词：LHCD microwave monitor VACUUM ARC PIN switch 

分 类 号：O539[理学—等离子体物理]