一种电子产品老化测试系统的设计与实现  

Design and Implementation of an Electronic Product Burn-in Test System

作　　者：张冰[1] 

机构地区：[1]深圳大学信息工程学院,广东深圳518060

出　　处：《工业控制计算机》2007年第8期13-14,共2页Industrial Control Computer

摘　　要：针对电子产品的可靠性问题,设计并实现了以单片机MSP430为核心的基于RS485总线的PC测试数据处理端、上位机测试过程监控端和下位机产品工作流程测试端的三级电子产品老化测试系统,并对各级测控节点的软硬件设计及测试实现方法作了介绍。该系统可用于实现电子产品功能和性能的在线老化测试,自动检测出产品元器件故障和生产工艺造成的隐藏缺陷,为改进生产工艺和提高产品质量提供决策。目前该系统已应用于智能电子锁的老化测试中。To deal with reliability problem of electronic products,a RS485 bus based burn-in product test system using MSP430 microcontrollers is designed and implemented,in which a 3-layer architecture--PC test data processing layer,master microprocessor test process display and monitor layer,slave microprocessor product workflow ：process test layer is used.Software and hardware design and test method of nodes in each layer of the system are introduced.The system can be used to implement online burn-in test of functions and reliability performance of electronic products,testing the component faults of the product and uncover many of the hidden faults due to complex production process automatically,hence providing solutions to improve production process and product quality.The system has been applied to the production process of burn-in test of an intelligent electronic lock.

关 键 词：老化测试系统 RS485总线 单片机 

分 类 号：TP274.4[自动化与计算机技术—检测技术与自动化装置]