一种改进的嵌入式存储器测试算法  

An Improved Test Algorithm of Embedded Memories

作　　者：苏彦鹏[1] 薛忠杰[2] 须自明[1] 韩磊[2] 

机构地区：[1]江南大学信息工程学院 [2]中电集团公司第58研究所

出　　处：《微计算机信息》2007年第01Z期110-112,共3页Control & Automation

摘　　要：基于一种适合于测试静态简化故障的MarchSS算法,提出了一种改进的嵌入式随机存取存储器测试算法-MarchSSE算法。该算法在测试长度不变的情况下,不仅能测出MarchSS算法所测试的全部的功能故障,而且还能检测出MarchSS算法所遗漏的固定开路故障,以及大部分的动态故障,故障覆盖率得到了大幅度地提高。Based on an test algorithm suited for static simple faults, An improved test algorithm of embedded RAMS-March SSE is presented. Under the condition of the same test length,The algorithm can not only detect all functional faults detected by March SS algorithm,but also can detect the stuck open fault which is not covered by the March SS algorithm and most dynamic faults. Fault coverage can be improved to a great extent.

关 键 词：故障原语 静态故障 动态故障 存储器测试 故障覆盖率 

分 类 号：TP333.8[自动化与计算机技术—计算机系统结构]