自动测试系统自检适配器自动设计技术  

Automatic Design Technique for the Self-Test Adapter of Automatic Design System

作　　者：孙宝江[1] 李晓白[1] 秦红磊[1] 沈士团[1] 

机构地区：[1]北京航空航天大学电子信息工程学院

出　　处：《测试技术学报》2007年第4期288-294,共7页Journal of Test and Measurement Technology

基　　金：国防基础科研基金资助项目(K1200060302);"十一五"国防预研基金资助项目(B0520060455)

摘　　要：采用面向信号方法建立仪器模型、开关模型,对系统所有仪器端口进行自动最优匹配,与相应开关构成自检回路,并实现自检回路自动布线.依据IVI(Interchangeable Virtual Instrument)-Signal Interface标准自动编写自检程序,较大地提高了设计效率和标准化程度.以某机载通讯设备自动测试系统为例,采用该技术可缩短ATS自检适配器开发周期至原来的1/3,显著降低了开发成本.Based on the signal-oriented instrument model and switch model, the technique finds best match for every instrument port and connects each other with switches to make a self-test loop, and implements the auto-routing for self-test loops. The self-test program can be generated automatically according to the IVI （Interchangeable Virtual Instrument ）-Signal Interface standard. So development efficiency and standardization degree are increased. An engineering application shows that this technique can shorten the development cycle to one third of original method, decrease greatly developing cost.

关 键 词：自动测试 自动测试系统 自检适配器 自动设计 可交换虚拟仪器(IVI) 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]