理论α系数在铝硅耐火材料X射线荧光光谱分析中的应用——理学基本参数法程序的应用之一  

APPLICABILITY OF THEORETICAL ALPHA COEFFICIENTS TO Al-Si REFRACTORY

作　　者：袁汉章[1] 刘洋[1] 秦颖 郭盛昉 张芳莉 宁爱萍 

机构地区：[1]北京有色金属研究总院,北京100088 [2]青岛耐火材料厂,青岛266043

出　　处：《光谱学与光谱分析》1990年第4期42-45,共4页Spectroscopy and Spectral Analysis

摘　　要：国内外早已采用熔融法X射线荧光光谱测定耐火材料中主元素,人们普遍认为采用X荧光测定铝硅耐火材料的最终产品,与化学法相比,分析时间要快好几倍。国内在测定铝硅耐火材料时,几乎都是用一套标样的回归法求取经验系数。本文将利用日本理学的基本参数法程序。Applicability of 'Rigaku Fundamental Parameter Method' to determine major elements (Al_2O_3, SiO_2, CaO, TiO_2 , Fe_2O_3, Na_2O, MgO and K_2O) in eight standard samples of Al-Si refractory was examined. The XRF equipment we used is 3070E with a Rh anode X-ray tube. We chose off-line 'auto analysis program' which calculates theoretical Alpha coefficients to Al-Si refractory material. The presumed reference values are calculated with the use of the absorption/enhancement term alone. Matrix correction constants α_(1i) are known as to theoretical Alpha coefficients. The result was comparable to that using the regression method. Theoretical Alpha coefficients method, which relieves us from preparation of many standard samples, can be satisfactory applied to the analysis of Al-Si refractory.

关 键 词：理论 系数 铝 硅 耐火材料 XRFA 

分 类 号：TQ175.711[化学工程—硅酸盐工业]