武器装备中电子产品模块级可靠性强化试验  

Module-Level Reliability Enhancement Test of Electronic Products in Weapon Equipment

作　　者：吴戈[1] 姜同敏[1] 万博[1] 

机构地区：[1]北京航空航天大学,北京100083

出　　处：《舰船电子对抗》2007年第4期111-113,共3页Shipboard Electronic Countermeasure

摘　　要：由于武器装备中的电子设备复杂性导致传统的可靠性试验很难满足其需求,一种全新概念的可靠性强化试验技术应运而生,它有效地解决了现代电子产品高可靠性、低开发成本和短研制周期之间的矛盾。分析了模块级电子产品的两类缺陷,给出了一些具体的试验方法。Traditional reliability test can not satisfy the need for the complexity of the electronic equipment in weapon system,so a new concept reliability enhancement test（RET） technology was put forward,which can effectively solve the contradiction among the high reliability, low product cost and the short research period. This paper analyzes two kinds of failure of the module-level e- lectronic products, and gives some test methods.

关 键 词：模块级 高加速寿命试验 高加速应力筛选 

分 类 号：TN03[电子电信—物理电子学]