低精细度短F-P腔的双波长正交解调  

Dual-Wavelength Quadrature Phase-Shifted Demodulation of Low-Finesse Short F-P Cavity

作　　者：赵江海[1] 史仪凯[1] 赵建林[2] 单宁[1] 

机构地区：[1]西北工业大学机电学院,陕西西安710072 [2]西北工业大学理学院光信息科学与技术研究所,陕西西安710072

出　　处：《光电子．激光》2007年第8期942-944,共3页Journal of Optoelectronics·Laser

基　　金：航空科学基金资助项目(04153068)

摘　　要：提出一种改进的采用双波长技术解调低精细度短F-P腔的方法。设计方案使用1×2密集波分复用器（DWDM）产生两路处于正交状态的输出信号，DWDM的滤波波长采用优化设计方法确定，信号处理采用Arctan算法实现F-P腔长度变化的解调。对变化范围为0．0～0．8μm的位移进行检测，结果表明，这种解调技术具有无源与精度高的优点，非常适用于低精细度短F-P腔的解调，灵敏度达到0．468°／nm，非线性度仅为1．2%。An improved two-wavelength quadrature-shifted demodulation approach of low-finesse Fabry-Perot（F-P） interferometer is reported. An optical passive device, dense wavelength division multiplexer（DWDM）,is used to generated two quadrature phase-shifted output signals in the design scheme. The filtering wavelength of DWDM is calculated by the optimization design method. The F-P cavity phase change is then extracted by using the Arctan algorithm. The scheme test is implemented by using F-P cavity whose gauge length ranges from 0 to 0. 8μm. Besides being totally passive and flexible,this modulation technique is potential to be used in the interrogation of low - finesse short F - P cavities with a sensitivity of 0. 468°/nm and the small nonlinearity of 1.2%.

关 键 词：位移检测 F-P腔 双波长解调 密集波分复用器(DWDM) 优化方法 

分 类 号：TN253[电子电信—物理电子学]