Mismatch Calibration Techniques in Successive Approximation Analog-to-Digital Converters  

逐次逼近型模数转换器中的失配校准技术(英文)

作　　者：王沛[1] 龙善丽[1] 吴建辉[1] 

机构地区：[1]东南大学国家专用集成电路系统工程技术研究中心,南京210096

出　　处：《Journal of Semiconductors》2007年第9期1369-1374,共6页半导体学报（英文版）

摘　　要：Comparator offset cancellation and capacitor self-calibration techniques used in a successive approximation analog-to-digital converter （SA-ADC） are described. The calibration circuit works in parallel with the SAADC by adding additional calibration clock cycles to pursue high accuracy and low power consumption, and the calibrated resolution can be up to 14bit. This circuit is used in a 10bit 3Msps successive approximation ADC. This chip is realized with an SMIC 0. 18μm 1.8V process and occupies 0.25mm^2 . It consumes 3. 1mW when operating at 1.8MHz. The measured SINAD is 55. 9068dB, SFDR is 64. 5767dB, and THD is - 74. 8889dB when sampling a 320kHz sine wave.设计了一种用于逐次逼近型模数转换器中的比较器失调和电容失配自校准电路.通过增加校准周期,该电容自校准结构即可与原电路并行工作,实现高精度与低功耗.校准精度可达14bit .采用该电路设计了一个用于逐次逼近型结构的10bit 3 Msps模数转换器单元,该芯片在SMIC 0.18μm1.8V工艺上实现,总的芯片面积为0.25mm2.芯片实测,在采样频率为1.8MHz ,输入320kHz正弦波时,信号噪声失真比为55.9068dB,无杂散动态范围为64.5767dB,总谐波失真为-74.8889dB,功耗为3.1mW.

关 键 词：analog-to-digital converter successive approximation self-calibration techniques 

分 类 号：TN792[电子电信—电路与系统]