云纹干涉法测量弛豫铁电陶瓷的电致伸缩应变  

Application of Moire Interferometry for Measuring the Electrostrictive Strain in Relaxor Ferroelectric Ceramics

作　　者：白辰阳[1] 桂治轮[1] 李龙土[1] 傅承诵[2] 

机构地区：[1]清华大学材料科学与工程系 [2]清华大学工程力学系

出　　处：《压电与声光》1997年第3期203-207,共5页Piezoelectrics & Acoustooptics

摘　　要：采用一种新的实验力学方法——反射式高灵敏度云纹干涉法测量了弛豫铁电陶瓷的电致伸缩效应。在铁电陶瓷上复制了１２００线／毫米位相型闪耀光栅的试件栅；在两束相干准直激光的照射下，采用ＣＣＤ摄像机及其微机实时图像处理系统，实时地获取了在电压作用下试件表面位移场的灵敏度为２４００线／毫米的云纹干涉条纹图；获得了试样表面的位移、应变量与外加电场强度的关系。A novel method of experimental mechanics——reflective high sensitivity moire interferometry was applied to measure the electrostrictive effect in relaxor ferroelectric ceramics. A phase type blazed specimen grating of 1 200lines/mm was successfully replicated on the surface of the ferroelectric ceramics;under the illumination of two coherent collimated laser beams, the moire interference fringe patterns of displacement fields on the surface of the specimen caused by the applied voltage were obtained; a moire fringe real time processing system with CCD and personal computer was adopted to collect and process the moire fringe automatically, and to calculate the strain under different applied electric fields. This is a new and effective experimental method for the strain testing of ferroelectric ceramics.

关 键 词：铁电陶瓷 电致伸缩效应 云纹干涉法 

分 类 号：TM280.6[一般工业技术—材料科学与工程] TQ174.75[电气工程—电工理论与新技术]