高阶微扰法的有效性研究  

Study of Validity of High-Order Small Perturbation Method

作　　者：童创明[1] 黄泽贵[1] 胡国平[1] 

机构地区：[1]空军工程大学导弹学院

出　　处：《电子学报》2007年第9期1745-1748,共4页Acta Electronica Sinica

基　　金：陕西省自然科学基金(No.2005F23)

摘　　要：通过二维地、海面发射率的研究,研究了高、低阶微扰法的有效性,分析了不同极化方式、表面模型和介电常数的影响,得到了均方根高度的有效范围,给出了高斯模型的相关长度的匹配范围.结果表明,模型差异不影响低阶微扰法求解时均方根高度的有效值,但对高阶微扰法的结果影响很大;高斯模型下,高阶微扰法求解时相关长度的有效值远小于低阶时的结果.理论与矩量法计算及测量值的比较,证明了高阶微扰法的有效性.Validity of small perturbation method （SPM） and high-order SPM （HSPM） is studied by evaluating the emissivity of two-dimensional rough ground and sea surface. The influences of surface model, permittivity and polarization on validity of HSPM and SPM are analyzed. The valid range of root means square （RMS） and correlation length （CL） for HSPM and SPM is obtained from two-dimensional rough surface. Results show that the diversity of different models does not affect the validity of SPM almost, which,however, is not true for HSPM.As for the Gaussian rough surface, the valid range of CL obtained by HSPM is far less than that by SPM.By comparing the simulation results,method of moment results and measured data, it is seen that HSPM is valid.

关 键 词：粗糙表面 发射率 高阶微扰法 有效性 

分 类 号：TP722.6[自动化与计算机技术—检测技术与自动化装置] P71[自动化与计算机技术—控制科学与工程]