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作 者:刘春凤[1] 黄焱球[1] 高兰芳[1] 周飞[1] 宛新武[1]
机构地区:[1]中国地质大学,武汉430074
出 处:《中国陶瓷》2007年第10期21-23,35,共4页China Ceramics
摘 要:采用传统电子陶瓷制备工艺制备了(K0.5Na0.5)(TaxNb1-x)O3无铅压电陶瓷。研究了不同Ta含量下(K0.5Na0.5)(TaxNb1-x)O3陶瓷的晶相组成及性能特征。结果表明,(K0.5Na0.5)(TaxNb1-x)O3陶瓷在低Ta含量时形成单一斜方相固溶体,但Ta含量达到0.08mol后则有K6Ta10.8O30次晶相产生。随着Ta的加入,陶瓷的体积密度逐渐增大,居里温度(Tc)逐渐降低。当Ta含量为0.08mol时陶瓷具有良好的铁电、压电性能和介电稳定性能,其压电常数d33为76pC/N。(K0.5Na0.5)(TaxNb1-x)O3 lead-free piezoelectric ceramics were prepared by the conventional ceramic technique. The properties of the ceramics were investigated. The results indicated that the ceramics had orthorhombic structures at room temperature when the addition of Ta was lower than 0.08mol, otherwise a secondary phase K6Ta10.8O30 would be formed. The ceramics became compact gradually, and the Curie temperature (Tc) shifted to lower temperature as Ta increased. When Ta content was 0.08mol, the ceramics exhibited stable dielectric properties and good ferroelectric and piezoelectric properties with the piezoelectric constant d33 of 76 pC/N.
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