XRD方法在聚晶金刚石复合片界面应力表征中应用的研究  

Study on the Applications of XRD in the Interface Stress Token of PDC

作　　者：刘芳[1] 范文捷[1] 江世景[1] 

机构地区：[1]中原工学院,河南郑州450007

出　　处：《稀有金属材料与工程》2007年第A02期340-342,共3页Rare Metal Materials and Engineering

基　　金：河南省自然科学基金项目(0411052200)

摘　　要：借助XRD方法对不同生产工艺、无齿、有齿型硬质合金基底制备的PDC制品进行了研究。表明:聚晶金刚石复合片在聚晶金刚石层内存在着宏观应力和微观应力;聚晶金刚石复合片表面应力大小可以反映聚晶金刚石层的应力存在状况;聚晶金刚石复合片残余应力的大小与XRD图谱的斜率成正比,因此XRD方法可以用于聚晶金刚石复合片应力的表征。The questions of the interface stress token of PDC were experienced and analysed in theory. Because of high temperature and high pressure in the production, great deal of stresses exist in the interface of diamond layer and Tungsten carbide substrate, and also exist in the inner bug of diamond. XRD was used to study PDC produced in different processes, no-tooth and tooth substrate. The results show macro-stresses and micro-stresses exist in the interface; the stresses in the surface can reflect the interface stresses of PDC; the amount of stresses is in direct ratio to XRD curveslope. So the method of XRD may be used to denote the stresses of PDC

关 键 词：PDC 应力 XRD斜率 表征 

分 类 号：TB302[一般工业技术—材料科学与工程]