Ni005A自动安平水准仪测微成像系统故障分析与调整  

Fault Analysis and Adjustment for Micrometer Imaging System of Ni005A Self-Adjusting Level

作　　者：欧同庚[1] 李江应[1] 陈志高[1] 杨博雄[1] 付辉清[1] 

机构地区：[1]中国地震局地震研究所

出　　处：《光学与光电技术》2007年第5期20-22,共3页Optics & Optoelectronic Technology

基　　金：地震联合基金(C07014)资助项目

摘　　要：分析了Ni005A自动安平水准仪测微成像系统的结构原理,介绍了此类仪器的测微光学系统常见故障判断与调整方法,提出了应用一小凸透镜和一块毛面白纸条对测微成像系统进行逐段检查的快速检修方法。The structure principle of micrometer imaging system of Ni005A self-adjusting level is analyzed in this paper. The common fault judgement and adjustment method of micrometer imaging system about the kind of instrument are summarized according to the working experience for many years. Meanwhile, the rapid examination and repairing method of piecemeal inspection by adopting small convex and coarse white paper is provided.

关 键 词：自动安平水准仪 测微 成像系统 逐段检查 

分 类 号：TN247[电子电信—物理电子学]