基于“纳米蘸笔技术”的单个纳米颗粒在不同基底表面的转移  

Transfer of single nanoparticle between different surfaces based on single-particle dip-pen nanolithography

作　　者：汪颖[1] 张益[1] 李宾[1] 吕军鸿[1] 黄一波[1] 胡钧[1] 

机构地区：[1]中国科学院上海应用物理研究所,上海210800

出　　处：《电子显微学报》2007年第5期484-487,共4页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.10335070;No.10404032;No.10675160;No.30470441);上海市纳米专项基金(No.0552NM033).

摘　　要：本文介绍了一种可定位拾取并重新放置单个纳米颗粒的方法。这种技术被命名为"单颗粒纳米蘸笔技术"。它采用原子力显微镜针尖作"笔",俘获基底表面的单个纳米金颗粒,并将之精确定位地转移到其它基底表面。　Single gold nanoparticles deposited on the solid substrates have been captured and re-deposited by using a novel technique termed as single particle dip-pen nanolithography（SP-DPN）.The SP-DPN employs an atomic force microscope（AFM）tip as a ＂pen＂,which is inked with gold nanoparticles in a one-by-one fashion.Nanoparticles adhered to the AFM tips can be controllably released and re-deposited on another surface.This method is opening opportunities for direct applications in single-electron electronics and nanofabrication of nanoelectromechanical system.

关 键 词：原子力显微镜 纳米颗粒 单颗粒纳米蘸笔技术 

分 类 号：TB383.1[一般工业技术—材料科学与工程]