A research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique  

作　　者：曹茂盛 Hou Zhiling Shi Xiaoling Wang Fuchi 

机构地区：[1]School of Material Science and Engineering, Beijing Institute of Technology, Beijing 100081, P.R. China [2]School of Science, Beijing University of Chemical Technology, Beijing 100029, P.R. China

出　　处：《High Technology Letters》2007年第3期279-282,共4页高技术通讯（英文版）

摘　　要：Resonant-cavity technique was introduced to measure the permittivity and loss tangent of low-loss dielectrics. The dielectric properties at 9-10 GHz are measured accurately at the temperature up to 800 ℃ by the resonant cavity technique. The only electrical parameters that need to be measured are quality factors （Q） and resonant length （L） of resonant cavity loaded and unloaded with dielectric sample. Moreover, the error caused by thermal expansion effect was resolved by error analysis and experimental calibration.

关 键 词：high temperature resonant cavity method PERMITTIVITY errors calibration 

分 类 号：TN751.2[电子电信—电路与系统]