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机构地区:[1]复旦大学专用集成电路与系统国家重点实验室,上海201203
出 处:《Journal of Semiconductors》2007年第10期1546-1550,共5页半导体学报(英文版)
摘 要:A novel MOS-only voltage reference is presented,which is based on the threshold voltage difference between p-type and n-type MOSFETs. Its precision is improved by the cancellation of the process variation. The reference has been successfully implemented in a Chartered 0.35μm CMOS process. The occupied chip area is 0. 022mm^2. Measurements indicate that without trimming, the average output voltage error is 6mV at room temperature compared with the simulation result. The temperature coefficient is 180ppm/℃ in the worst case in the temperature range of 0 to 100℃ ,and the line regulation is ± 1.1%. The reference is applied in an adaptive power MOSFET driver.提出了一种新的纯MOS结构的基准电压源,它利用pMOS和nMOS的阈值电压差来抵消工艺偏差,提高了基准的精度.该电路经过Chartered0.35mm标准CMOS工艺成功流片,芯片面积为0.022mm2.测试结果表明:输出平均电压在室温下与仿真结果的绝对误差为6mV,在0~100℃范围内温度系数为180ppm/℃,电源调整率为±1.1%.该基准应用于自适应功率管驱动器中.
关 键 词:MOS-only voltage reference threshold voltage temperature coefficient line regulation
分 类 号:TN432[电子电信—微电子学与固体电子学]
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