基于傅里叶光谱仪在高温环境下材料光谱发射率测试技术  

Measurement of Spectral Emissivity Based on FT-IR

作　　者：何小瓦[1] 戴景民[2] 辛春锁[2] 王宗伟[2] 徐辉[1] 

机构地区：[1]航天材料及工艺研究所,北京100076 [2]哈尔滨工业大学自动检测与过程控制系统研究所,哈尔滨150001

出　　处：《宇航材料工艺》2007年第5期13-17,共5页Aerospace Materials & Technology

摘　　要：在对傅里叶红外光谱仪与传统的色散型光谱分析仪进行比较的基础上,综述了基于该装置的高温红外光谱发射率测量技术的国内外发展现状。在详细介绍各具特色的装置结构、工作原理、测量温度范围和测量水平的同时,评述了这项技术的特点和局限性,并对其未来发展趋势进行了展望。Based on the comparison of FT - IR and traditional dispersion spectrum analyzer, recent status in emissivity measurement with FT - IR is reviewed. After description of different kinds of equipments＇ structure, operating principle, measurement temperature range and accuracy, the related comments about the technique＇ s characteristics and limitations are stated. At the same time, the developing trend of the technique is also pointed out.

关 键 词：光谱发射率 发射率测量 高温环境 FT-IR 

分 类 号：TH811[机械工程—仪器科学与技术]