EFPI腔内损耗对干涉条纹可见度的影响  

Affection of the Loss in EFPI Cavity on the Visibility of Interferometric Fringe

作　　者：王文辕[1] 尹汝海[1] 邸志刚[1] 朱开宇[1] 刘佳宇[1] 安永丽[1] 

机构地区：[1]河北理工大学信息学院,河北唐山063009

出　　处：《光纤与电缆及其应用技术》2007年第5期6-8,共3页Optical Fiber & Electric Cable and Their Applications

摘　　要：利用多光束干涉原理和几何光学方法,分析了非本征F-P干涉仪(EFPI)腔内损耗对干涉仪的影响,详细推导了EFPI腔长与反射光干涉条纹可见度之间的关系,确定了在可测条纹可见度的要求下EFPI腔长的范围。Based on the theory of multiple-beam interference and geometry optics, the affection of the loss in EFPI cavity on the interferometer is analyzed, and the relationship between EFPI cavity length and the visibility of reflective interferometric fringe is deduced in detail. The scope of EFPI cavity length is determined under the requirement of observable visibility of fringe.

关 键 词：非本征F—P干涉仪 损耗 条纹可见度 

分 类 号：TN253[电子电信—物理电子学]