电子背散射衍射分析技术的应用  

APPLICATION OF ELECTRON BACK-SCATTER DIFFRACTION ANALYSIS TECHNIQUE

作　　者：李凡[1] 黄海波[1] 王雷[1] 

机构地区：[1]东南大学分析测试中心,南京210096

出　　处：《理化检验（物理分册）》2007年第10期505-508,516,共5页Physical Testing and Chemical Analysis(Part A:Physical Testing)

摘　　要：简要介绍了电子背散射衍射分析技术的基本原理和特点,并通过用电子背散射衍射分析方法对几种晶体材料(包括试样的制备)在物相鉴定、晶体取向、晶粒尺寸及晶界分布、材料失效机理等方面的实例分析表明,该技术是一种揭示晶体材料微观结构的很好的方法。The mechanism and the basic principle of electron baekscatter diffraction （EBSD） were introduced briefly. The several crystal materials were analyzed by use EBSD method in substance appraise, crystal orientation, grain size, crystal boundry distribution and material failure mechanism. The results showed that EBSD technique was a good method to detect the microscopic structure of crystal materials.

关 键 词：电子背散射衍射 晶体材料 应用实例 

分 类 号：TG115.23[金属学及工艺—物理冶金]