Near-Field Characterization of Optical Micro/Nanofibres  

作　　者：马哲 王姗姗 杨青 童利民 

机构地区：[1]State Key Laboratory of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, Hangzhou 310027

出　　处：《Chinese Physics Letters》2007年第10期3006-3008,共3页中国物理快报（英文版）

基　　金：Supported by the National Natural Science Foundation of China under Grant Nos 60425517 and 60378036.

摘　　要：Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres （MNFs） by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs, supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity （with a 195-nm period） near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres （MNFs） by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs, supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity （with a 195-nm period） near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.

关 键 词：SUBWAVELENGTH PHOTONICS INTEGRATION CHANNEL WAVE-GUIDES SILICA NANOWIRES DIAMETER SILICA MICROSCOPY 

分 类 号：TN25[电子电信—物理电子学]