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作 者:M. Y. Nadee Nadeem Iqbal M. F. Wasiq A. U. Khosa
机构地区:[1]Department of Playsics, Balaauddin Zakariya University Multan, Pakistan
出 处:《Chinese Physics Letters》2007年第7期2068-2069,共2页中国物理快报(英文版)
摘 要:The high field electrical conduction mechanism for the widely used ZnS thin films in the microelectronic industry is investigated. Experimental data on the dc conduction as a function of the applied bias for the A1-ZnS-A1 devices is carefully compared with the theoretical equations given by Schottky and Poole-Freukel. The resu/ts yield the value of the coefficient of the barrier lowering compatible with the Schottky theory rather than the Poole-Frenkel theory, which are also in agreement with the results reported earlier by Maekawa [Phys. Rev. Lett. 24 (1970) 1175]The high field electrical conduction mechanism for the widely used ZnS thin films in the microelectronic industry is investigated. Experimental data on the dc conduction as a function of the applied bias for the A1-ZnS-A1 devices is carefully compared with the theoretical equations given by Schottky and Poole-Freukel. The resu/ts yield the value of the coefficient of the barrier lowering compatible with the Schottky theory rather than the Poole-Frenkel theory, which are also in agreement with the results reported earlier by Maekawa [Phys. Rev. Lett. 24 (1970) 1175]
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