Negative Goos-Hanchen Effect in Thin-Film Fabry-Perot Filter  

作　　者：李明宇 刘旭 马欣 厉以宇 顾培夫 

机构地区：[1]State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027 [2]National Center for Nanoscience and Technology, Ueijing 100080

出　　处：《Chinese Physics Letters》2007年第7期2091-2093,共3页中国物理快报（英文版）

基　　金：Supported by the National Natural Science Foundation of China under Grant No 60478038, and the National Basic Research Programme of China under Grant No 2004CB19803.

摘　　要：We investigate the Goos-Hgnchen effect of a Gaussian light beam reflected by the thin-film Fabry-Perot filter. It is shown that the Goos-Hanchen shift can be either negative or positive, The Gaussian-beam analysis and stationary phase method are introduced to calculate the lateral shift between the incident beam and the reflected beam at different wavelengths and to analyse the Goos-Hgnchen effect in the thin-film Fabry-Perot filter, The effect of the incident beam diameter is also discussed,We investigate the Goos-Hgnchen effect of a Gaussian light beam reflected by the thin-film Fabry-Perot filter. It is shown that the Goos-Hanchen shift can be either negative or positive, The Gaussian-beam analysis and stationary phase method are introduced to calculate the lateral shift between the incident beam and the reflected beam at different wavelengths and to analyse the Goos-Hgnchen effect in the thin-film Fabry-Perot filter, The effect of the incident beam diameter is also discussed,

关 键 词：PHOTONIC CRYSTALS LATERAL DISPLACEMENT REFRACTION BEAM SLAB PERMITTIVITY PERMEABILITY INCIDENT EPSILON MU 

分 类 号：O484[理学—固体物理]