相变存储器测试系统中的脉冲信号的改善  

Improvement of Pulse Signal about Test System on Phase Change Memory

作　　者：梁爽[1] 宋志棠[1] 刘波[1] 陈小刚[1] 封松林[1] 

机构地区：[1]中国科学院上海微系统与信息技术研究所纳米技术研究室

出　　处：《计算机测量与控制》2007年第10期1281-1282,1294,共3页Computer Measurement &Control

基　　金：国家重点基础研究发展计划(2006CB302700);中国科学院资助项目(Y2005027);上海市科委资助项目(05JC14076;0552nm043;AM0517;06QA14060;06XD14025;0652nm003;06DZ22017)

摘　　要：相变存储器测试系统由于PCI控制卡中的总线信号之间的串扰,严重影响了施加在器件单元上的波形;以保证对C-RAM(Chalcogenide-Random Access Memory)进行非晶化操作时脉冲信号下降沿的速度和整个信号的完整性,针对以上问题分别从串口与单片机通信控制继电器和利用PCI控制卡控制继电器两个方面提出了解决方案,并进行了相应的硬件电路和软件设计;结果发现非晶化操作时脉冲信号下降速度加快,并且消除了信号的失真;改善后的测试系统对器件一致性的参数的提取发挥了重要作用,为芯片的电路设计奠定了基础。The disturbance between the bus signals of PCI control card exists on test system of phase change memory, which results in the distortion of the pulse signal used to work on device unit on phase change memory. To make sure that the fall velocity of the amorphizing reset pulse rapid and the pulse is good on the proceeding of test, two methods are proposed to settle down these problems, one is used the serial port of computer, another is to amend the PCI control card. Corresponding hardware circuit and software program about this two methods are designed successfully. The improved test system has played the vital role to extract the device uniform parameters and laid the foundation for the chip circuit design.

关 键 词：相变存储器 测试系统 串口 PCI控制卡 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]